Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Memory corruption may occur while accessing a variable during extended back to back tests.
Memory corruption while processing the TESTPATTERNCONFIG escape path.
Memory corruption while processing escape code, when DisplayId is passed with large unsigned value.
Memory corruption while handling test pattern generator IOCTL command.
Memory corruption while processing DDI command calls.
Memory corruption while performing sensor register read operations.
Memory corruption while station LL statistic handling.
Memory corruption while processing DDI call with invalid buffer.
Memory corruption during concurrent buffer access due to modification of the reference count.
Memory corruption while acquire and update IOCTLs during IFE output resource ID validation.
Memory corruption while handling invalid inputs in application info setup.
Memory corruption while parsing clock configuration data for a specific hardware type.
Memory corruption while passing pages to DSP with an unaligned starting address.
Memory corruption while processing user packets to generate page faults.
Memory corruption while processing IPA statistics, when there are no active clients registered.
Memory corruption during the network scan request.
Memory corruption when another driver calls an IOCTL with invalid input/output buffer.
Memory corruption while parsing IPC frequency table parameters for LPLH that has size greater than expected size.
Memory corruption may occur while processing IOCTL call for DMM/WARPNCC CONFIG request.
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