CVE-2024-53017

MEDIUM EPSS 0.2%
Published Jun 3, 20251y ago · Modified Jun 17, 20262w ago
6.6 CVSS 3.1
Medium
Find Similar
Published Jun 3, 2025 1y ago
Last Modified Jun 17, 2026 2w ago

Description

Memory corruption while handling test pattern generator IOCTL command.

CVSS Details

Base Score
6.6
Exploitability
1.8
Impact
4.7
Vector string
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
Attack Vector Local
Attack Complexity Low
Privileges Required Low
User Interaction None
Scope Unchanged
Confidentiality Low
Integrity High
Availability Low

Threat Intelligence

EPSS Exploit Probability
0.2% percentile
Exploit & Patch Status
No Known Exploit
No Patch Available

Weaknesses 1

CWE-823

Affected Products 8

VendorProductVersionRange
qualcommsdm429w_firmware*any
qualcommsdm429w*any
qualcommsnapdragon_429_mobile_platform_firmware*any
qualcommsnapdragon_429_mobile_platform*any
qualcommwcn3620_firmware*any
qualcommwcn3620*any
qualcommwcn3660b_firmware*any
qualcommwcn3660b*any

References 1

  • docs.qualcomm.com https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html
    Vendor Advisory

Remediation

No remediation data recorded yet

Check vendor advisories and the NVD entry for patch availability.