Transient DOS while parsing ESP IE from beacon/probe response frame.
Transient DOS while processing TID-to-link mapping IE elements.
Information disclosure while processing a packet at EAVB BE side with invalid header length.
Transient DOS while parsing BTM ML IE when per STA profile is not included.
Information Disclosure when a user-level driver performs QFPROM read or write operations on Fuse regions.
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
Information disclosure while processing the hash segment in an MBN file.
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
Transient DOS when registration accept OTA is received with incorrect ciphering key data IE in Modem.
Transient DOS while parsing the received TID-to-link mapping element of the TID-to-link mapping action frame.
Transient DOS while parsing per STA profile in ML IE.
Transient DOS while handling beacon frames with invalid IE header length.
Cryptographic issue may occur while encrypting license data.
Transient DOS while creating NDP instance.
Memory corruption while processing a secure logging command in the trusted application.
Transient DOS while processing a frame with malformed shared-key descriptor.
Transient DOS while processing received beacon frame.
A vulnerability was discovered in Samsung Mobile Processors Exynos 1280, Exynos 2200, Exynos 1330, Exynos 1380, and Exynos 2400 where they do not properly check the length of the data, which can lead
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.